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Small Angle X-Ray Scattering (SAXS) with Synchrotron Radiation Sources

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Abstract

This is not a treatise on small angle scattering; it is a presentation of the application of small angle scattering and the potentialities of synchrotron sources where conventional sources prove limited. A brief introduction describing the technique aims to provide the reader with no more than the qualitative tools necessary to understanding the case studies discussed further on. For a more thorough discussion, the reader is referred to standard texts in the field.

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Notes

  1. 1.

    Williams and Carter [1] estimated that all TEMs, since they first became available up to the publishing date of their book (1996), have only examined 0.3 mm\(^{3}\) of material.

  2. 2.

    In the context of SAXS the term ‘resolution’ is used as a synonym for ‘smallest measurable angle’ \(2 \theta _{min}\), which in turn corresponds to the largest measurable object \(D_{max}\). Either \( 2 \theta _{min}\) or \(D_{max}\) are used to indicate the attainable resolution. Note that the usage made by microscopists or spectroscopists is different. There, resolution stays for the smallest detail that can be appreciated.

  3. 3.

    For a complete list of SAXS beamlines see under “SAXS” in Wikipedia.

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Polizzi, S., Spinozzi, F. (2015). Small Angle X-Ray Scattering (SAXS) with Synchrotron Radiation Sources. In: Mobilio, S., Boscherini, F., Meneghini, C. (eds) Synchrotron Radiation. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-55315-8_11

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  • DOI: https://doi.org/10.1007/978-3-642-55315-8_11

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