Colloid formation in copper-implanted fused silica and silicate glasses

https://doi.org/10.1016/0168-583X(94)96275-8Get rights and content

Abstract

Copper implantations (90 keV, 5 × 1016 ions/cm2) were made into fused silica, borosilicate glasses and soda-lime glass. The copper distribution has been found to vary according to glass type. The optical absorption band characteristic of the implanted metal optical properties was observed only for copper-implanted fused silica. The absorption for all the other samples was either not observable or was negligibly small, however very small metallic particles are present also in the soda-lime glass. A subsequent nitrogen implantation (100 keV, 1.5 × 1017 ions/cm2) completely eliminated the copper-colloid induced absorption in the copper-implanted fused silica, while it facilitated the formation of copper-colloids into the soda-lime glass.

References (10)

  • R.F. Haglund et al.
  • P. Mazzoldi et al.
  • R. Bertoncello et al.

    J. Non-Cryst. Solids

    (1993)
  • P. Mazzoldi et al.

    Nucl. Instr. and Meth.

    (1993)
  • H. Hosono et al.

    J. Non-Cryst. Solids

    (1992)
There are more references available in the full text version of this article.

Cited by (0)

1

Permanent address: Saha Institute of Nuclear Physics, 1/AP Bidhan Nagar, Calcutta-700064, India.

View full text
Copyright © 1994 Published by Elsevier B.V.