Issue 15, 2021

Nanoscale characterization of an all-oxide core–shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods

Abstract

The electrical properties of an all-oxide core–shell ZnO–Co3O4 nanorod heterojunction were studied in the dark and under UV-vis illumination. The contact potential difference and current distribution maps were obtained utilizing new methods in dynamic multifrequency atomic force microscopy (AFM) such as electrostatic and conductive intermodulation AFM. Light irradiation modified the electrical properties of the nanorod heterojunction. The new techniques are able to follow the instantaneous local variation of the photocurrent, giving a two-dimensional (2D) map of the current–voltage curves and correlating the electrical and morphological features of the heterostructured core–shell nanorods.

Graphical abstract: Nanoscale characterization of an all-oxide core–shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods

Supplementary files

Article information

Article type
Communication
Submitted
29 Apr 2021
Accepted
19 May 2021
First published
20 May 2021
This article is Open Access
Creative Commons BY-NC license

Nanoscale Adv., 2021,3, 4388-4394

Nanoscale characterization of an all-oxide core–shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods

I. Dobryden, R. Borgani, F. Rigoni, P. Ghamgosar, I. Concina, N. Almqvist and A. Vomiero, Nanoscale Adv., 2021, 3, 4388 DOI: 10.1039/D1NA00319D

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