• Open Access

Fast Multifrequency Measurement of Nonlinear Conductance

Riccardo Borgani, Mojtaba Gilzad Kohan, Alberto Vomiero, and David B. Haviland
Phys. Rev. Applied 11, 044062 – Published 19 April 2019

Abstract

We describe a phase-coherent multifrequency lock-in measurement technique that uses the inverse Fourier transform to reconstruct the nonlinear current-voltage characteristic of a nanoscale junction. The method provides separation of the galvanic and displacement currents in the junction and easy cancellation of the parasitic displacement current from the measurement leads. These two features allow us to overcome traditional limitations imposed by the low conductance of the junction and the high capacitance of the leads, thus providing an increase in measurement speed of several orders of magnitude. We demonstrate the method in the context of conductive atomic force microscopy, acquiring current-voltage characteristics at every pixel while scanning at standard imaging speed.

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  • Received 17 December 2018
  • Revised 3 April 2019

DOI:https://doi.org/10.1103/PhysRevApplied.11.044062

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Riccardo Borgani1,*, Mojtaba Gilzad Kohan2, Alberto Vomiero2, and David B. Haviland1

  • 1Nanostructure Physics, KTH Royal Institute of Technology, Stockholm SE-106 91, Sweden
  • 2Department of Engineering Sciences and Mathematics, Luleå University of Technology, Luleå SE-971 87, Sweden

  • *borgani@kth.se

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Issue

Vol. 11, Iss. 4 — April 2019

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